X-ray Fluorescence (XRF)
and X-ray Diffraction (XRD) Analysis
are based on the interaction of matter with x-rays
which are short-wavelength, high-energy beams of electromagnetic radiation. XRF analysis
utilizes the fact that when a primary x-ray beam strikes a substance, it excites elements at the atomic level, causing electron movement. Each element has characteristic emissions of secondary (fluorescent) x-rays when these movements occur, identifying the elemental composition of the substance. For instance, XRF
can tell that iron and sulfur are in a substance and the quantity of each. XRD analysis utilizes the fact that when a primary x-ray beam strikes a substance, diffraction takes place creating a pattern that is unique to the crystalline structure(s) of the substance.XRD
patterns are used to identify the compound(s) in the substance. For instance, XRD can identify and quantify the iron-sulfur compound in a substance such as marcasite - iron disulfide orthohomic, pyrite - iron disulfide cubic, or pyrrhotite - iron sulfide. Together, XRF and XRDgive a comprehensive picture of the composition of a substance by providing elemental and compound identification and quantification. These non-destructive, rapid analysis techniques are widely used to determine the composition of metals, alloys, glass, ceramics, minerals and countless other materials.
TheDELTA series handheld XRF analyzers
are configured with powerful miniature X-ray tubes, Si-PIN, or highly advanced Silicon Drift Detector (SDD) detection, specialized filters, and multi-beam optimization for the ultimate in XRFfield analysis.
The Terra Mobile XRD System, a high performing, completely contained, battery operated, closed-beam portableXRD, provides full phase ID of major, minor and trace components with a quick XRF scanof elements Ca - U. Its unique, minimal sample prep technique and sample chamber allow for fast, in-fieldanalysis.
The BTX Benchtop XRD Systemis a fast, low cost, small footprint, benchtop XRDfor full phase ID of major, minor and trace components and quick XRF scan of elements Ca - U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysisrivaling the performance of large costly lab units.